Semiconductor devices - mechanical and climatic test methods - high temperature operating life 半导体器件.机械和气候试验方法.高温操作寿命
2.
Semiconductor devices - mechanical and climatic test methods - part 23 : high temperature operating life 半导体器件.机械和气候试验方法.第23部分:高温操作寿命
3.
Semiconductor devices - mechanical and climatic test methods - part 23 : high temperature operating life 半导体器件.机械和气候试验方法.第23部分:高温操作寿命
4.
Semiconductor devices - mechanical and climatic test methods - part 23 : high temperature operating life iec 60749 - 23 : 2004 ; german version en 60749 - 23 : 2004 半导体器件.机械和气候试验方法.第23部分:高温操作寿